Materials Science and Engineering

Advanced Material Characterization Techniques

This session explores cutting-edge methodologies used to analyze and characterize materials at both macro and micro scales. Participants will learn about advanced techniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM), which provide detailed insights into material structure and surface properties. The session also covers X-ray diffraction (XRD) for phase identification and crystallographic analysis, as well as spectroscopy methods like energy-dispersive X-ray spectroscopy (EDS) and Raman spectroscopy for compositional and chemical analysis. Emphasis will be placed on the practical applications of these techniques in research and industry, highlighting their role in solving complex materials science challenges. This session aims to equip participants with the skills to select and apply the most appropriate characterization methods for their specific material science needs.